ECE 451    SPRING 2025

Section      Time         Instructor                   Room

X               12:00 MW J. Schutt-Aine             3015 ECEB

Instructor

Jose Schutt-Aine, 5042 ECEB, jesa@illinois.edu

Book

M. Steer, Microwave and RF Design, 2nd Edition, SciTech Publishing, 2013.

Notes

Lab notes can be downloaded from course web site at: http://emlab.illinois.edu/ece451/labs.html

Class notes can be downloaded from course web site at: http://emlab.illinois.edu/ece451/notes

Grading Policy

Lab                                    35% of total

Homework                        20% of total

Midterm                            10% of total

Lab Final                           15% of total

Final                                  20% of total

Lab Reports Policy

Instructions for preparing and returning lab reports will be given and are described in the Introduction for the Laboratory Notes.

Homework

Homework assignments will be given throughout the semester. Assignments will be passed on a Wednesday and will be due two weeks later and should be uploaded into Canvas.

Midterm Exam

Monday, March 10, 12:00 – 12:50 pm, 3015 ECEB

Laboratory Instructors (Lab 5076 ECEB)

Yi Zhou - yizhou18@illinois.edu

Gabriel Muniz - gam5@illinois.edu

Course Web Site

http://emlab.illinois.edu/ece451


ECE 451 SCHEDULE: SPRING 2025

 

Lec

Mo

Date

Topic

Ch

Lab(Tuesday & Thursday)

 

JAN

W-22

NO CLASS

 

 

1

 

M-27

RF Detection

5

 

 

 

W-29

NO CLASS

 

 

2

 

F-31

Transmission Lines

5

 

3

FEB

M-3

Smith Chart

6

Lab 1 – Detection of RF Power - Benchview

4

 

W-5

Applications of Smith Chart

5

 

5

 

F-7

Waveguides

6

 

6

 

M-10

Scattering Parameters

9

Lab 2 – Slotted line

7

 

W-12

Scattering Parameters of TL

9

 

8

 

F-14

Flow Graph

10

 

9

 

M-17

Error Models

 

Lab 3 – Automated Scalar Reflectometry

 

 

W-19

NO CLASS

 

 

10

 

M-24

Time-Domain Reflectometry

 

Lab 4 – Network Analyzer Error Correction

11

 

W-26

TRL Calibration Method

 

 

12

 

F-28

Application of TRL

 

 

13

MAR

M-3

TL  Characterization

 

Lab 5 – PNA and TDR

14

 

W-5

Frequency Dependence of TL

 

 

 

 

M-10

MIDTERM EXAM

 

Lab 6 – Extraction of TL Parameters

 

 

W-12

NO CLASS

 

 

 

 

M-17

SPRING BREAK

 

 

 

 

W-19

SPRING BREAK

 

 

15

 

M-24

Requirements of Channels

 

Lab 7 – Wafer Tests and Eye Diagrams

16

 

W-26

Eye Diagram Measurements

 

 

17

 

M-31

Macro-Modeling

 

Lab 8 – TRL Calibration

 

APR

W-2

Circuit Synthesis

 

 

18

 

M-7

Linear Amplifiers

19

Lab 9 – Advanced Techniques

19

 

W-9

Power Amplifiers

 

 

20

 

M-14

X-Parameters

 

Lab 10 – Amplifier Measurements

21

 

W-16

X- Parameters

 

 

22

APR

M-21

X-Parameters

 

Lab 11 – Generating X Parameters via Simulation

23

 

W-23

Gain Compression

 

 

24

 

M-28

Signal Integrity

 

Lab 12 – Measuring X Parameters

25

 

W-30

Signal Integrity

 

 

26

MAY

M-5

Packaging

 

 

 

 

W-7

FINAL EXAM